Download Debug Automation from Pre-Silicon to Post-Silicon by Mehdi Dehbashi, Görschwin Fey PDF

By Mehdi Dehbashi, Görschwin Fey

This ebook describes computerized debugging methods for the insects and the faults which seem in several abstraction degrees of a procedure. The authors hire a transaction-based debug method of structures on the transaction-level, saying the right kind relation of transactions. the automatic debug strategy for layout insects unearths the aptitude fault applicants at RTL and gate-level of a circuit. Debug recommendations for common sense insects and synchronization insects are tested, allowing readers to localize the main tricky insects. Debug automation for electric faults (delay faults)finds the doubtless failing speedpaths in a circuit at gate-level. some of the debug techniques defined in attaining excessive analysis accuracy and decrease the debugging time, shortening the IC improvement cycle and lengthening the productiveness of designers.

  • Describes a unified framework for debug automation used at either pre-silicon and post-silicon stages;
  • Provides techniques for debug automation of a method at various degrees of abstraction, i.e., chip, gate-level, RTL and transaction level;
  • Includes options for debug automation of layout insects and electric faults, in addition to an infrastructure to debug NoC-based multiprocessor SoCs.

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Additional info for Debug Automation from Pre-Silicon to Post-Silicon

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The elements SoTr and EoTr model transactions more coarsely than the elements SoRq, EoRq, SoRp and EoRp. Fields master and slave specify the master and slave IDs which are an abstraction of the higher address bits. Field type can be read Rd or write W r. Field address indicates the slave address symbolically as SAME, SEQ, and OTHER. Field tag indicates the transaction number and is only used for buses that allow non-blocking requests and out-of-order responses [GF09]. In this book, we show a transaction without considering the field tag.

6 presents experimental results on benchmark circuits. 7 summarizes this chapter. 1 Integration of Formal Debugging with Testbench-Based Verification In this section we explain how SAT-based debugging and counterexample generation are integrated in one flow. In the approach, the diagnostic traces help creating high quality counterexamples for automated design debugging to increase the diagnosis accuracy. The overall approach which consists of three main steps is shown in Fig. 1. Debugging, diagnostic trace generation, and running the testbench to validate diagnostic traces are three main steps of the approach.

LBA MSPI LMBA RND QBF #Gates k #FC #CE k #FC #CE k #FC #CE k #FC #CE k #FC #CE 3938 4674 2938 2883 3942 3294 6249 2848 4776 1 5 1 4 1 9 2 56 3 4 1 2 2 26 2 15 2 4 14 21 21 16 20 19 21 20 21 3 2 1 2 3 1 2 2 2 >99 88 6 56 4 1 16 15 2 19 21 11 19 12 6 20 11 11 3 1 1 2 3 1 2 3 2 >99 2 6 56 4 1 18 >99 2 19 4 12 18 13 7 21 12 21 2 1 1 2 3 1 2 2 1 45 2 9 >99 4 1 60 15 3 21 21 21 21 21 21 21 21 21 3 2 1 2 3 2 2 3 2 821 1198 223 260 867 1297 1217 1834 1 1 1 2 2 1 2 1 21 1 1 11 11 1 12 13 1 1 1 2 2 1 2 1 2 5 58 14 66 93 28 11 6 5 20 17 1 12 19 19 1 1 1 2 2 1 2 1 2 5 58 14 66 93 28 11 14 3 20 8 1 12 17 18 1 1 1 2 2 1 2 1 2 5 58 14 60 93 32 11 21 21 21 21 21 21 21 21 2 1 1 2 2 1 2 1 5 5 69 14 60 93 35 11 60 58 3 56 4 6 16 >99 2 5 9 3 7 3 6 5 6 5 62 13 5 1 58 2 14 6 60 3 93 1 28 3 11 2 LBA and MSPI.

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